A lasso-based diagnostic framework for multivariate statistical process control

Technometrics

Volumn 53, Issue 3, 2011, Pages 297-309

  Zou, Changliang ^a   Jiang, Wei ^b   Tsung, Fugee ^c  

^a NANKAI UNIVERSITY   (China)

^b Shanghai Jiao Tong University   (China)

^c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

BIC; Consistency; Fault isolation; High dimensional; Least squares approximation; Variable selection

Indexed keywords

BIC; CONSISTENCY; FAULT ISOLATION; HIGH-DIMENSIONAL; LEAST SQUARE; VARIABLE SELECTION;

APPROXIMATION ALGORITHMS; ELECTRIC FAULT CURRENTS; FAULT DETECTION; LEAST SQUARES APPROXIMATIONS; MULTIVARIANT ANALYSIS; QUALITY CONTROL;

STATISTICAL PROCESS CONTROL;

EID: 79961042386     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1198/TECH.2011.10034     Document Type: Article

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