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Volumn 40, Issue 31, 2011, Pages 7967-7975
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Evolution of orientation degree, lattice dynamics and electronic band structure properties in nanocrystalline lanthanum-doped bismuth titanate ferroelectric films by chemical solution deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
BISMUTH TITANATE;
BLT FILMS;
CHEMICAL SOLUTION DEPOSITION;
COMPOSITION RANGES;
DIELECTRIC FUNCTIONS;
ELECTRONIC BAND STRUCTURE;
ELLIPSOMETRIC SPECTRA;
EMISSION BANDS;
FILM PACKING DENSITY;
FOUR-PHASE;
GRAIN SIZE;
HIGHER FREQUENCIES;
LA DOPING;
LAYERED MODEL;
NANOCRYSTALLINE FILMS;
NANOCRYSTALLINES;
OPTICAL RESPONSE;
ORIENTATION DEGREE;
OXYGEN VACANCY DEFECTS;
PHONON MODE;
PHOTOLUMINESCENCE SPECTRUM;
PHOTON ENERGY RANGE;
POLYCRYSTALLINE;
PREFERRED ORIENTATIONS;
PURE PEROVSKITE PHASE;
RAMAN ACTIVE MODES;
ROOM TEMPERATURE;
ROOT MEAN SQUARE ROUGHNESS;
ROUGH LAYER;
SI (100) SUBSTRATE;
SUBSTITUTION EFFECT;
BAND STRUCTURE;
BISMUTH;
CHEMICALS;
CRYSTAL LATTICES;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON MOBILITY;
ELECTRONIC STRUCTURE;
FERROELECTRICITY;
LANTHANUM;
LANTHANUM ALLOYS;
OPTICAL CONSTANTS;
OXYGEN VACANCIES;
PEROVSKITE;
PHONONS;
PHOTOLUMINESCENCE;
SEMICONDUCTOR DOPING;
SOLIDS;
SPECTROSCOPIC ELLIPSOMETRY;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
FERROELECTRIC FILMS;
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EID: 79960900896
PISSN: 14779226
EISSN: 14779234
Source Type: Journal
DOI: 10.1039/c1dt10443h Document Type: Article |
Times cited : (18)
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References (51)
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