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Materials Letters

Volumn 65, Issue 21-22, 2011, Pages 3234-3236

Structural, optical and electrical characterization of ZnO:Ga thin films for organic photovoltaic applications

(2) You, Zhong Zhi a Hua, Gu Jin a

a SOUTH CENTRAL UNIVERSITY FOR NATIONALITIES (China)

Author keywords

Microstructure; Optical properties; Semiconductors; Thin films

Indexed keywords

DISPERSION BEHAVIOR; DISPERSION MODELS; FOUR-POINT PROBE; GLASS SUBSTRATES; GRAIN SIZE; OPTICAL AND ELECTRICAL CHARACTERIZATION; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL CHARACTERIZATION; OPTICAL ENERGY GAP; OPTOELECTRICAL PROPERTIES; ORGANIC PHOTOVOLTAICS; OSCILLATOR PARAMETERS; POLYCRYSTALLINE; RF-MAGNETRON SPUTTERING; UV-VISIBLE SPECTROPHOTOMETER; ZNO;

DISPERSION (WAVES); ELECTRIC PROPERTIES; GALLIUM ALLOYS; GROWTH TEMPERATURE; MAGNETRON SPUTTERING; MICROSTRUCTURE; OPTICAL CONSTANTS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

OXIDE FILMS;

EID: 79960892210 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/j.matlet.2011.06.117 Document Type: Article

Times cited : (20)

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