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Volumn 61, Issue 18, 2007, Pages 3809-3814

Combined AFM, XPS, and contact angle studies on treated indium-tin-oxide films for organic light-emitting devices

Author keywords

Indium tin oxide; Organic light emitting device; Surface modification; Surface property

Indexed keywords

ATOMIC FORCE MICROSCOPY; SURFACE PROPERTIES; SURFACE TREATMENT; TIN COMPOUNDS; WETTING; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34250667035     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2006.12.063     Document Type: Article
Times cited : (62)

References (35)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.