Assessing the delay of plastic relaxation onset in SiGe islands grown on pit-patterned Si(001) substrates

Applied Physics Letters

Volumn 99, Issue 3, 2011, Pages

  Boioli, F ^a   Gatti, R ^a   Grydlik, M ^b   Brehm, M ^b   Montalenti, F ^a   Miglio, Leo ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; SUBSTRATES;

ELASTICITY THEORY; GE CONTENT; PLASTIC RELAXATION; SI (001) SUBSTRATE; SIGE ISLANDS;

SI-GE ALLOYS;

EID: 79960829303     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3615285     Document Type: Article

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