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Physical Review Letters

Volumn 106, Issue 15, 2011, Pages

Terminating surface electromigration at the source

(4) Bevan, Kirk H a,b Zhu, Wenguang a,c Guo, Hong b Zhang, Zhenyu a,c,d

a OAK RIDGE NATIONAL LABORATORY (United States)

b MCGILL UNIVERSITY (Canada)

c UNIVERSITY OF TENNESSEE (United States)

d UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

CU(1 1 1); DIFFUSION PATHWAYS; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORY; KINK SITES; PERIODIC TABLE; STEP EDGE; SUBSTRATE METALS;

BINDING SITES; DENSITY FUNCTIONAL THEORY; PHOSPHORUS;

ELECTROMIGRATION;

EID: 79960640776 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.106.156404 Document Type: Article

Times cited : (16)

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