The effect of embedded Pb on Cu diffusion on Pb/Cu(1 1 1) surface alloys

Surface Science

Volumn 600, Issue 9, 2006, Pages 1901-1908

  Anderson, M L ^a   Bartelt, N C ^b   Feibelman, P J ^a   Swartzentruber, B S ^a   Kellogg, G L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Copper; Density functional calculations; Lead; Low energy electron microscopy; Scanning tunneling microscopy; Self assembly; Surface diffusion

Indexed keywords

DIFFUSION; ELECTRON MICROSCOPY; LEAD; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY;

DIFFUSION ENERGIES; LOW-ENERGY ELECTRON MICROSCOPY; SURFACE DIFFUSION;

COPPER ALLOYS;

EID: 33646141372     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.02.034     Document Type: Article

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