Fast fluorescence techniques for crystallography beamlines

Journal of Applied Crystallography

Volumn 44, Issue 4, 2011, Pages 772-778

  Stepanov, Sergey ^a   Hilgart, Mark ^a   Yoder, Derek W ^a   Makarov, Oleg ^a   Becker, Michael ^a   Sanishvili, Ruslan ^a   Ogata, Craig M ^a   Venugopalan, Nagarajan ^a   Aragão, David ^b   Caffrey, Martin ^b   Smith, Janet L ^c   Fischetti, Robert F ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c UNIVERSITY OF MICHIGAN MEDICAL SCHOOL   (United States)

Author keywords

beamline automation; data acquisition; high throughput crystallography; Macromolecular crystallography; multi wavelength anomalous diffraction; X ray fluorescence

Indexed keywords

BEAMLINE AUTOMATION; HIGH-THROUGHPUT CRYSTALLOGRAPHY; MACROMOLECULAR CRYSTALLOGRAPHY; MULTIWAVELENGTH; X RAY FLUORESCENCE;

FLUORESCENCE; MACROMOLECULES; MINERALOGY; RADIATION DAMAGE; X RAYS;

X RAY CRYSTALLOGRAPHY;

EID: 79960628265     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889811016748     Document Type: Article

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