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Materials Chemistry and Physics

Volumn 129, Issue 3, 2011, Pages 733-739

Investigation of optical properties of core-shell silicon nanowires

(3) Swain, Bhabani S a Swain, Bibhu P b Hwang, Nong M a

a Seoul National University (South Korea)

b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

Core shell SiNWs; FESEM; Reflectivity; UV vis

Indexed keywords

ANTI-REFLECTION; ATMOSPHERIC PRESSURE CHEMICAL VAPOR DEPOSITION; BAND EDGE; CORE-SHELL; CRYSTALLINE CORE; FESEM; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HYDROGEN DILUTION; LOCALIZED STATE; OPTICAL REFLECTION; PHOTON ENERGY; PROCESS PARAMETERS; SILICON NANOWIRES; TECHNOLOGICAL APPLICATIONS; UV-VIS;

ABSORPTION; ATMOSPHERIC PRESSURE; CHEMICAL VAPOR DEPOSITION; FIELD EMISSION MICROSCOPES; FLOW RATE; NANOWIRES; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SILICON OXIDES; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS SILICON;

EID: 79960565767 PISSN: 02540584 EISSN: None Source Type: Journal
DOI: 10.1016/j.matchemphys.2011.04.046 Document Type: Article

Times cited : (10)

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