Wall shear stress sensor based on the optical resonances of dielectric microspheres

Measurement Science and Technology

Volumn 22, Issue 7, 2011, Pages

  Ayaz, U K ^a   Ioppolo, T ^a   Otugen M V ^a  

^a Southern Methodist University   (United States)

Author keywords

micro technology; microsensors; morphology dependent resonances; shear stress sensor; whispering gallery modes

Indexed keywords

DIELECTRIC MATERIALS; LIGHT EMISSION; MICROSENSORS; MICROSPHERES; OPTICAL RESONATORS; QUANTUM OPTICS; RESONANCE; RESONATORS; SPHERES; STRESS MEASUREMENT; WALLS (STRUCTURAL PARTITIONS); WHISPERING GALLERY MODES;

DIELECTRIC MICROSPHERES; DIELECTRIC SPHERES; MEASUREMENT RESOLUTION; MICRO TECHNOLOGY; MORPHOLOGY DEPENDENT RESONANCES; SHEAR-STRESS SENSORS; WALL SHEAR STRESS; WALL-SHEAR STRESS SENSORS;

SHEAR STRESS;

EID: 79960247509     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/7/075203     Document Type: Article

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