A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1029-1036

  Voortman, Lenard M ^a   Stallinga, Sjoerd ^a   Schoenmakers, Remco H M ^b   van Vliet, Lucas J ^a   Rieger, Bernd ^a,b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Thermo Fisher Scientific   (United States)

Author keywords

CTF; Nonuniform fast Fourier transform; Specimen thickness; TEM; Tilted geometry; Tomography

Indexed keywords

CONTRAST TRANSFER FUNCTION; CRYO-ELECTRON TOMOGRAPHY; CTF; DEFOCUS; ENVELOPE FUNCTIONS; FAST ALGORITHMS; FORWARD MODELS; NONUNIFORM FAST FOURIER TRANSFORM; PHASE-CONTRAST; PROCESSING TIME; RADON TRANSFORM; SPECIMEN THICKNESS; TILTED GEOMETRY; TOMOGRAPHIC RECONSTRUCTION;

ALGORITHMS; COMPUTATIONAL COMPLEXITY; ELECTRIC IMPEDANCE TOMOGRAPHY; FAST FOURIER TRANSFORMS;

COMPUTER SIMULATION;

ACCURACY; ALGORITHM; ARTICLE; CALCULATION; CONTRAST; CONTRAST TRANSFER FUNCTION; FOURIER TRANSFORMATION; IMAGE PROCESSING; IMAGE RECONSTRUCTION; OSCILLATION; QUANTITATIVE ANALYSIS; SIMULATION; THICKNESS; TILTING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; WHITE NOISE;

EID: 79960010288     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.03.001     Document Type: Article

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