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Volumn 81, Issue 2, 2000, Pages 83-98
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Correction of high-resolution data for curvature of the Ewald sphere
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Author keywords
043; Depth of field; Electron microscopy
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Indexed keywords
ELECTRIC POTENTIAL;
ELECTRON BEAMS;
ELECTRON MICROSCOPES;
ELECTRON SCATTERING;
IMAGE ANALYSIS;
IMAGE RECONSTRUCTION;
EWALD SPHERE;
FOURIER COEFFICIENTS;
ELECTRON MICROSCOPY;
ANALYTICAL ERROR;
ARTICLE;
CHEMICAL STRUCTURE;
COMPUTER SIMULATION;
CRYSTAL;
DATA ANALYSIS;
ELECTRON MICROSCOPY;
FOURIER TRANSFORMATION;
THREE DIMENSIONAL IMAGING;
CRYSTALLOGRAPHY;
DEPTH PERCEPTION;
EQUIPMENT DESIGN;
FOURIER ANALYSIS;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, ELECTRON;
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EID: 0034160037
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(99)00120-5 Document Type: Article |
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Times cited : (85)
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References (16)
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