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Volumn 3, Issue , 2005, Pages 3-748
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An approach to the correction of distance-dependent defocus in electron microscopic reconstruction
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Author keywords
[No Author keywords available]
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Indexed keywords
FOURIER TRANSFORMS;
IMAGE PROCESSING;
OPTICAL RESOLVING POWER;
TRANSFER FUNCTIONS;
3D FOURIER COEFFICIENTS;
CONTRAST TRANSFER FUNCTION (CTF);
FOURIER-BASED CORRECTION;
ELECTRON MICROSCOPES;
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EID: 33749254452
PISSN: 15224880
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICIP.2005.1530500 Document Type: Conference Paper |
Times cited : (4)
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References (6)
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