Fully three-dimensional defocus-gradient corrected backprojection in cryoelectron microscopy

Ultramicroscopy

Volumn 110, Issue 9, 2010, Pages 1128-1142

  Kazantsev, Ivan G ^a   Klukowska, Joanna ^b   Herman, Gabor T ^b   Cernetic, Laslo ^c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b City University of New York   (United States)

^c UNIVERSITY OF SZEGED   (Hungary)

Author keywords

Contrast transfer function; Correction; Cryoelectron microscopy; Distance dependence; Reconstruction; Stationary phase approximation

Indexed keywords

3D OBJECT; BACK-PROJECTION; CLASSICAL METHODS; CONTRAST TRANSFER FUNCTION; CRYO-ELECTRON MICROSCOPY; DEFOCUS; DEPTH OF FIELD; DISTANCE-DEPENDENT BLURRING; GRADIENT-CORRECTED; LIMITING FACTORS; LINE INTEGRALS; MATHEMATICAL JUSTIFICATION; PROJECTION DATA; PROJECTION DIRECTION; STATIONARY-PHASE APPROXIMATION;

COMPUTERIZED TOMOGRAPHY; REPAIR; TRANSFER FUNCTIONS;

THREE DIMENSIONAL;

ARTICLE; COMPUTER SIMULATION; CONTROLLED STUDY; CRYOELECTRON MICROSCOPY; DEFOCUS GRADIENT CORRECTED BACKPROJECTION; FILTER; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; MATHEMATICS; NOISE; PHANTOM; THREE DIMENSIONAL IMAGING;

EID: 77955516433     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.04.002     Document Type: Article

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