XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures

Journal of Electron Spectroscopy and Related Phenomena

Volumn 184, Issue 7, 2011, Pages 399-409

  Sunding, M F ^a   Hadidi, K ^a   Diplas, S ^a,b   Lovvik O M ^a,b   Norby, T E ^a   Gunnaes A E ^a  

^a UNIVERSITY OF OSLO   (Norway)

^b SINTEF MATERIALS AND CHEMISTRY   (Norway)

Author keywords

Charge referencing; DFT; Lanthanum hydroxide; Lanthanum oxide; XPS

Indexed keywords

CRYSTAL STRUCTURE; DENSITY FUNCTIONAL THEORY; GOLD NANOPARTICLES; PHOTOELECTRONS; PHOTONS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

CHARGE REFERENCING; DEPOSITION OF GOLD NANOPARTICLES; K-ALPHA RADIATION; LANTHANUM HYDROXIDE; PEAK FITTING; SATELLITE INTENSITIES; VALENCE BAND SPECTRA; X RAY PHOTOELECTRON SPECTRA;

LANTHANUM OXIDES;

EID: 79959855796     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2011.04.002     Document Type: Article

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