Structure formation at the nanometric scale during current oscillations at the Si/electrolyte contact

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 8, Issue 6, 2011, Pages 1734-1738

  Grzanna, Jürgen ^a   Notz, Thilo ^b   Stempel, Thomas ^a   Lewerenz, Hans J ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b ALBERT EINSTEIN INSTITUT   (Germany)

Author keywords

Electrolyte; Oscillation; Silicon; Structure formation

Indexed keywords

CURRENT OSCILLATION; HELMHOLTZ; MICROSCOPIC MODELS; MORPHOLOGICAL MODEL; N TYPE SILICON; NANOMETRIC SCALE; OSCILLATION; OSCILLATOR MODEL; OXIDE STRUCTURES; RECURRENCE RELATIONS; STRUCTURE FORMATION; STRUCTURE FORMATIONS; SUSTAINED OSCILLATIONS; SYNCHRONIZATION STATE;

DIFFERENTIAL EQUATIONS; INTEGRAL EQUATIONS; LEAD OXIDE; NANOPORES; SILICON COMPOUNDS; SILICON OXIDES;

ANODIC OXIDATION;

EID: 79959632919     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.201000030     Document Type: Article

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