Stratified structure of anodically formed mesoporous silica

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 6, 2009, Pages 1229-1234

  Chazalviel, Jean Noël ^a   Cortès, Robert ^a   Maroun, Fouad ^a   Ozanam, François ^a  

^a LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANODISATION; ELECTROCHEMICAL BEHAVIOUR; FLUORIDE ELECTROLYTE; INCREASING FUNCTIONS; MESOPOROUS SILICA; NANOMETRIC SCALE; OSCILLATION MECHANISM; OXIDE LAYER; OXIDE MORPHOLOGIES; SEM; SILICON SINGLE CRYSTALS; STRATIFIED STRUCTURE; SUBMICROMETER THICKNESS; THEORETICAL MODELLING; X RAY REFLECTIVITY;

OXIDE FILMS; SILICA; SILICON WAFERS;

SINGLE CRYSTALS;

EID: 67649987664     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881044     Document Type: Article

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