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Volumn 16, Issue 3, 2009, Pages 173-180

Model for current oscillations at the Si/electrolyte contact: Extension to spatial resolution

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FLUORINE COMPOUNDS; LATTICE MISMATCH; SEMICONDUCTOR QUANTUM WELLS; SILICON COMPOUNDS;

EID: 63849272895     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2982553     Document Type: Conference Paper
Times cited : (9)

References (18)
  • 14
    • 63849187608 scopus 로고    scopus 로고
    • J. Grzanna, T. Notz and H. J. Lewerenz, Stress-induced 1-dimensional model for current oscillations at the Si/electrolyte contact, submitted to phys. stat. sol. (a).
    • J. Grzanna, T. Notz and H. J. Lewerenz, "Stress-induced 1-dimensional model for current oscillations at the Si/electrolyte contact", submitted to phys. stat. sol. (a).
  • 17
    • 0001056197 scopus 로고
    • Zhur. Fiz. Khim. USSR
    • S. Ya. Elovich and C. M. Zhabrova, Zhur. Fiz. Khim. USSR, 13, 1761 (1939).
    • (1939) , vol.13 , pp. 1761
    • Elovich, S.Y.1    Zhabrova, C.M.2
  • 18
    • 0004270415 scopus 로고
    • Addison-Wesley, Reading. MA USA
    • K. Simon, Mechanics, Addison-Wesley, Reading. MA USA 1971.
    • (1971) Mechanics
    • Simon, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.