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Volumn 109, Issue 9, 2011, Pages

A non-filamentary model for unipolar switching transition metal oxide resistance random access memories

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC REGIONS; CORRELATED ELECTRONS; CURRENT VOLTAGE; ELECTRON CORRELATION EFFECT; EXPERIMENTAL EVIDENCE; HUBBARD; MESOSCOPICS; MOTT TRANSITIONS; RANDOM ACCESS MEMORIES; RESISTANCE RANDOM ACCESS MEMORY; STRONG ELECTRON CORRELATIONS; TRANSITION-METAL OXIDES; TRANSPORT EQUATION; TUNNELING CURRENT; UNIPOLAR SWITCHING; WORKING MECHANISMS;

EID: 79959533149     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3581193     Document Type: Conference Paper
Times cited : (23)

References (32)
  • 2
    • 35748974883 scopus 로고    scopus 로고
    • Nanoionics-based resistive switching memories
    • DOI 10.1038/nmat2023, PII NMAT2023
    • R. Waser and M. Aono, Nat. Mater. 6, 833 (2007). 10.1038/nmat2023 (Pubitemid 350064191)
    • (2007) Nature Materials , vol.6 , Issue.11 , pp. 833-840
    • Waser, R.1    Aono, M.2
  • 3
    • 0030737730 scopus 로고    scopus 로고
    • Current switching of resistive states in magnetoresistive manganites
    • DOI 10.1038/40363
    • A. Asamitsu, Y. Tomioka, H. Kuwahara, and Y. Tokura, Nature 388, 50 (1997). 10.1038/40363 (Pubitemid 27283883)
    • (1997) Nature , vol.388 , Issue.6637 , pp. 50-52
    • Asamitsu, A.1    Tomioka, Y.2    Kuwahara, H.3    Tokura, Y.4
  • 9
    • 79959531358 scopus 로고    scopus 로고
    • International Technology Roadmafor Semiconductors (ITRS). Available at
    • International Technology Roadmap for Semiconductors (ITRS) 2007. Available at http://www.itrs.net/Links/2007ITRS/2007-Chapters/2007-Interconnect. pdf.
    • (2007)
  • 14
    • 79959494226 scopus 로고    scopus 로고
    • Material and Process Optimization of Correlated Electron Random Access Memories (CeRAMs), (in press)
    • J. Celinska, C. McWilliams, C. A. Paz de Araujo, and K.-H. Xue, Material and Process Optimization of Correlated Electron Random Access Memories (CeRAMs), J. Appl. Phys. (in press).
    • J. Appl. Phys.
    • Celinska, J.1    McWilliams, C.2    Paz De Araujo, C.A.3    Xue, K.-H.4
  • 15
  • 17
    • 0001376260 scopus 로고
    • 10.1098/rspa.1931.0162
    • A. H. Wilson, Proc. R. Soc. A 133, 458 (1931). 10.1098/rspa.1931.0162
    • (1931) Proc. R. Soc. A , vol.133 , pp. 458
    • Wilson, A.H.1
  • 20
    • 36049053404 scopus 로고
    • 10.1103/RevModPhys.40.677
    • N. F. Mott, Rev. Mod. Phys. 40, 677 (1968). 10.1103/RevModPhys.40.677
    • (1968) Rev. Mod. Phys. , vol.40 , pp. 677
    • Mott, N.F.1
  • 21
  • 22
    • 0004032707 scopus 로고
    • 2nd Ed. (Taylor and Francis, London)
    • N. F. Mott, Metal-Insulator Transitions, 2nd Ed. (Taylor and Francis, London, 1990), p. 128.
    • (1990) Metal-Insulator Transitions , pp. 128
    • Mott, N.F.1
  • 23
    • 3643122627 scopus 로고
    • 10.1103/PhysRevLett.68.2512
    • Y. Meir and N. S. Wingreen, Phys. Rev. Lett. 68, 2512 (1992). 10.1103/PhysRevLett.68.2512
    • (1992) Phys. Rev. Lett. , vol.68 , pp. 2512
    • Meir, Y.1    Wingreen, N.S.2
  • 24
    • 79959518538 scopus 로고    scopus 로고
    • 0 G, where the 1/Latin small letter h with stroke coefficient on the last term was set to 1
    • 0 G, where the 1/Latin small letter h with stroke coefficient on the last term was set to 1.
  • 25
    • 0000211877 scopus 로고
    • 10.1098/rspa.1963.0204
    • J. Hubbard, Proc. R. Soc. A 276, 238 (1963). 10.1098/rspa.1963.0204
    • (1963) Proc. R. Soc. A , vol.276 , pp. 238
    • Hubbard, J.1
  • 29
    • 0003409205 scopus 로고
    • For an explanation of Fig., see, (Cambridge University Press, Cambridge), p, 65-57 66. 66
    • For an explanation of Fig., see S. Datta, Electronic Transport in Mesoscopic Systems (Cambridge University Press, Cambridge, 1995), pp. 55-57 66, 65-57 66.
    • (1995) Electronic Transport in Mesoscopic Systems , pp. 55-57
    • Datta, S.1
  • 31
    • 33748513895 scopus 로고    scopus 로고
    • Bias polarity dependent data retention of resistive random access memory consisting of binary transition metal oxide
    • DOI 10.1063/1.2339032
    • K. Kinoshita, T. Tamura, M. Aoki, Y. Sugiyama, and H. Tanaka, Appl. Phys. Lett. 89, 103509 (2006). 10.1063/1.2339032 (Pubitemid 44359658)
    • (2006) Applied Physics Letters , vol.89 , Issue.10 , pp. 103509
    • Kinoshita, K.1    Tamura, T.2    Aoki, M.3    Sugiyama, Y.4    Tanaka, H.5


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