SCOPUS 정보 검색 플랫폼

Volumn 109, Issue 9, 2011, Pages

Charge transport in dielectrics via tunneling between traps

Author keywords

[No Author keywords available]

Indexed keywords

HIGH DENSITY; IONIZATION ENERGIES; SILICON NITRIDE FILM; THERMAL IONIZATION ENERGY; THERMALLY STIMULATED PROCESS;

ACTIVATION ENERGY; IONIZATION; SILICON NITRIDE;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 79959529196 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3587452 Document Type: Article

Times cited : (76)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.