Double-pulse-single-event transients in combinational logic

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Ahlbin, J R ^a   Loveless, T D ^a   Ball, D R ^a   Bhuva, B L ^a   Witulski, A F ^a   Massengill, L W ^a   Gadlage, M J ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b NSWC   (United States)

Author keywords

charge sharing; double pulse single event transients; pulse quenching; pulse width; radiation environment; SER; SET; single event; single event transient; soft error

Indexed keywords

CHARGE SHARING; DOUBLE-PULSE-SINGLE-EVENT TRANSIENTS; PULSE QUENCHING; PULSE WIDTH; RADIATION ENVIRONMENT; SER; SET; SINGLE EVENT; SINGLE EVENT TRANSIENTS; SOFT ERROR;

COMPUTER AIDED DESIGN; COMPUTER SIMULATION;

TRANSIENTS;

EID: 79959307359     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784486     Document Type: Conference Paper

References (13)

1. O. Musseau, F. Gardic, P. Roche, T. Corbiere, R. A. Reed, S. Buchner, P. McDonald, J. Melinger, L. Tran, and A. B. Campbell, "Analysis of multiple bit upsets (MBU) in a CMOS SRAM," IEEE Trans. Nucl. Sci., vol. 43, no. 6, pp. 2879-2888, Dec. 1996.
2. S. P. Buchner and M. P. Baze, "Single-event transients in fast electronic circuits," NSREC Short Course, 2001, Sec. V.
3. D. G. Mavis and P. H. Eaton, "Soft error rate mitigation techniques for modern microcircuits," in Proc. IRPS, Apr. 2002, pp. 216-225.
4. B. D. Olson, D. R. Ball, K. M. Warren, L. W. Massengill, N. F. Haddad, S. E. Doyle, and D. McMorrow, "Simultaneous Single Event Charge Sharing and Parasitic Bipolar Conduction in a Highly-Scaled SRAM Design," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2132-2136, Dec. 2005.
5. O.A. Amusan, A. F. Witulski, L. W. Massengill, B. L. Bhuva, P. R. Fleming, M. L. Alles, A. L. Sternberg, J. D. Black, and R. D. Schrimpf, "Charge Collection and Charge Sharing in a 130 nm CMOS Technology," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3253-3258, Dec. 2006.
6. V. Ferlet-Cavrois, P. Paillet, D. McMorrow, N. Fel, J. Baggio, S. Girard, O. Duhamel, J. S. Melinger, M. Gaillardin, J. R. Schwank, P. E. Dodd, M. R. Shaneyfelt, and J. A. Felix, "New insights into single event transient propagation in chains of inverters - evidence for propagation-induced pulse broadening," IEEE Trans on Nucl. Sci., vol. 54, no. 6, pp. 2338-2346, Dec. 2007.
7. B. D. Olson, D. R. Ball, K. M. Warren, L. W. Massengill, N. F. Haddad, S. E. Doyle, and D. McMorrow, "Simultaneous Single Event Charge Sharing and Parasitic Bipolar Conduction in a Highly-Scaled SRAM Design," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2132-2136, Dec. 2005.
8. O.A. Amusan, A. F. Witulski, L. W. Massengill, B. L. Bhuva, P. R. Fleming, M. L. Alles, A. L. Sternberg, J. D. Black, and R. D. Schrimpf, "Charge Collection and Charge Sharing in a 130 nm CMOS Technology," IEEE Trans. Nucl. Sci., vol. 53, no. 6, pp. 3253-3258, Dec. 2006.
9. J. R. Ahlbin, L. W. Massengill, B. L. Bhuva, B. Narasimham, M. J. Gadlage, and P. H. Eaton, "Single event transient pulse quenching in Advanced CMOS logic," IEEE Trans. Nucl. Sci., vol. 56, no. 6, pp. 3050-3056, Dec. 2009.
10. B. Narasimham, V. Ramachandran, B. L. Bhuva, R. D. Schrimpf, A. F. Witulski, W. T. Holman, L. W. Massengill, J. D. Black, W. H. Robinson, D. McMorrow, "On-chip characterization of single event transient pulse widths", IEEE Trans. on Dev. and Mat. Rel., vol. 6, p. 542-549, 2006.
11. M. J. Gadlage, J. R. Ahlbin, B. Narasimham, B. L. Bhuva, L. W. Massengill, R. A. Reed, R. D. Schrimpf, and G. Vizkelethy, "Scaling Trends in SET Pulse Widths in Sub-100 nm Bulk CMOS Processes," IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3336-3341, Dec. 2010.
12. J. R. Ahlbin, M. J. Gadlage, D. R. Ball, A. W. Witulski, B. L. Bhuva, R. A. Reed, G. Vizkelethy, and L. W. Massengill, "The Effect of Layout Topology on Single-event transient pulse quenching in a 65 nm bulk CMOS process," IEEE Trans. Nucl. Sci., vol. 57, no. 6, pp. 3380-3385, Dec. 2010.
13. ACCRE Computing Cluster. Nashville, TN [Online] Available: http://www.accre.vanderbilt.edu