Reliability and performance characterization of a mems-based non-volatile switch

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Gaddi, Roberto ^a   Schepens, Cor ^a   Smith, Charles ^a   Zambelli, Cristian ^b   Chimenton, Andrea ^b   Olivo, Piero ^b  

^a Cavendish Kinetics Ltd   (Netherlands)

^b UNIVERSITY OF FERRARA   (Italy)

Author keywords

CMOS; harsh environment; MEMS; non volatile memory; NVM

Indexed keywords

ACCELERATION FORCE; CMOS; DATA RETENTION; ENVIRONMENTAL APPLICATIONS; HARSH ENVIRONMENT; INTEGRATED MEMS; MEMS SWITCHES; NON-VOLATILE; NON-VOLATILE MEMORIES; NVM; OPERATING PRINCIPLES; PERFORMANCE CHARACTERIZATION; RADIATION ENVIRONMENTS; RF-MEMS; STICTION FORCES; TEMPERATURE RANGE;

RELIABILITY;

EID: 79959304686     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784472     Document Type: Conference Paper

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