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Volumn 208, Issue 6, 2011, Pages 1475-1479

Porous silicon in low moisture content dry gas by impedance spectroscopy

Author keywords

impedance spectroscopy; moisture detection; porous electrodes; porous silicon

Indexed keywords

AGILENT 4294A IMPEDANCE ANALYZER; ANODIZATIONS; DRY GAS; IMPEDANCE SPECTROSCOPY; LOW HUMIDITY; MESH STRUCTURES; METAL ELECTRODES; MOISTURE DETECTION; MOISTURE MOLECULES; PORE DIMENSIONS; PORE MORPHOLOGY; POROUS ELECTRODES; POROUS LAYERS; POROUS STRUCTURES; SCREEN PRINTING TECHNIQUE; WATER VAPOUR;

EID: 79959213447     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201000053     Document Type: Article
Times cited : (5)

References (21)
  • 12
    • 79959214571 scopus 로고    scopus 로고
    • Xentaur hyper thin film aluminium oxide based moisture sensor, Xentaur Corporation
    • Xentaur hyper thin film aluminium oxide based moisture sensor, Xentaur Corporation,.
  • 21
    • 0003501694 scopus 로고    scopus 로고
    • fourth ed. (Tata McGraw-Hill Publishing, New Delhi)
    • E. O. Doeblin, Measurement System and Application, fourth ed. (Tata McGraw-Hill Publishing, New Delhi, 2002), p. 818.
    • (2002) Measurement System and Application , pp. 818
    • Doeblin, E.O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.