Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography data

Microscopy and Microanalysis

Volumn 17, Issue 3, 2011, Pages 418-430

  Keenan, Michael R ^a   Smentkowski, Vincent S ^b   Ulfig, Robert M ^c   Oltman, Edward ^c   Larson, David J ^c   Kelly, Thomas F ^c  

^a General Electric Global Research Center ^*  (United States)

^b GE GLOBAL RESEARCH   (United States)

^c CAMECA   (United States)

Author keywords

atom probe tomography (APT); multivariate statistical analysis (MVSA); PCA

Indexed keywords

EID: 79958833323     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000353     Document Type: Article

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