Multivariate statistical analysis of three-spatial-dimension TOF-SIMS raw data sets

Analytical Chemistry

Volumn 79, Issue 20, 2007, Pages 7719-7726

  Smentkowski, V S ^a   Ostrowski, S G ^a   Braunstein, E ^b   Keenan, M R ^c   Ohlhausen, J A ^c   Kotula, P G ^c  

^a GENERAL ELECTRIC COMPANY   (United States)

^b LOCKHEED MARTIN   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MASS SPECTROMETRY; SPECTRUM ANALYSIS; STATISTICAL METHODS; VISUALIZATION;

MULTIVARIATE STATISTICAL ANALYSIS (MVSA); RAW DATA SETS; SINGLE SPECTRUM; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS);

IMAGE ANALYSIS;

ANALYTIC METHOD; ARTICLE; AUTOMATION; IMAGE RECONSTRUCTION; MEASUREMENT; MULTIVARIATE ANALYSIS; STATISTICAL ANALYSIS; THREE DIMENSIONAL IMAGING; TIME OF FLIGHT MASS SPECTROMETRY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

EID: 35448952940     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac071019o     Document Type: Article

References (12)

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11. Imaris, Bitplane AG, Zurich, Switzerland. http://www.bitplane.com.
12. Keenan, M. K.; Smentkowski, V. S.; Ohlhausen, J. A.; Kotula, P. G. Submitted to Surf. Interface Anal.