A comparison of multivariate statistical analysis protocols for ToF-SIMS spectral images

Surface and Interface Analysis

Volumn 41, Issue 2, 2009, Pages 88-96

  Smentkowski, V S ^a   Ostrowski, S G ^a   Keenan, M R ^b  

^a GENERAL ELECTRIC COMPANY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

AXSIA; Chemometrics; MCR; MVA; PCA; Spectral image; SVD; ToF SIMS

Indexed keywords

DECISION MAKING; ELECTRON EMISSION; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; MASS SPECTROMETRY; MULTIVARIANT ANALYSIS; PRINCIPAL COMPONENT ANALYSIS; ROTATION; SECONDARY ION MASS SPECTROMETRY; SECURITY OF DATA;

AXSIA; CHEMOMETRICS; MCR; MVA; PCA; SPECTRAL IMAGE; SVD; TOF-SIMS;

SINGULAR VALUE DECOMPOSITION;

EID: 60349094760     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2973     Document Type: Article

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