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Volumn 42, Issue 5, 2011, Pages 1007-1015

Off-resonance Raman analysis of wurtzite CdS ground to the nanoscale: Structural and size-related effects

Author keywords

CdS; II VI semiconductors; Photoluminescence; TEM; XRD

Indexed keywords

GRINDING (MACHINING); HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HYDRAULICS; HYDROSTATIC PRESSURE; II-VI SEMICONDUCTORS; OPTICAL PROPERTIES; PLATELETS; STACKING FAULTS; X RAY DIFFRACTION; ZINC SULFIDE;

EID: 79958287543     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.2793     Document Type: Article
Times cited : (74)

References (74)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.