Characterization of defect levels in chemically deposited CdS films in the cubic-to-hexagonal phase transition

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 4, 1997, Pages 2282-2286

  Vigil, O ^a   Riech, I ^a   Garcia Rocha, M ^b   Zelaya Angel, O ^b  

^a UNIVERSITY OF HAVANA   (Cuba)

^b DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031522457     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580735     Document Type: Article

References (14)

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