The comparison between CdS thin films grown on Si (111) substrate and quartz substrate by femtosecond pulsed laser deposition

Applied Physics A: Materials Science and Processing

Volumn 84, Issue 1-2, 2006, Pages 143-148

  Tong, X L ^a   Jiang, D S ^a   Hu, W B ^a   Liu, Z M ^a   Luo, M Z ^a  

^a WUHAN UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM SULFIDE; PULSED LASER DEPOSITION; QUARTZ; SCANNING ELECTRON MICROSCOPY; SILICON; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE QUALITY; FEMTOSECOND PULSED LASER DEPOSITION; QUARTZ SUBSTRATES;

THIN FILMS;

EID: 33646762487     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-006-3574-4     Document Type: Article

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