Phonon confinement in SiC nanocrystals: Comparison of the size determination using transmission electron microscopy and Raman spectroscopy

Applied Spectroscopy

Volumn 61, Issue 8, 2007, Pages 855-859

  Havel, M ^a,b,d   Baron, D ^a   Mazerolles, L ^c   Colomban, Ph ^a  

^a CNRS   (France)

^b ONERA   (France)

^c CNRS   (France)

^d Drexel University

Author keywords

Nanocrystal; Phonon confinement; Raman; SiC; Size

Indexed keywords

PHONONS; RAMAN SPECTROSCOPY; SILICON CARBIDE; SIZE DETERMINATION; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

PHONON CONFINEMENT; SODIUM NITRATE; SPATIAL CORRELATION MODEL;

NANOCRYSTALS;

EID: 34548154804     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370207781540187     Document Type: Conference Paper

References (30)

1. M. H. Berger, N. Hochet, and A. R. Bunsell, Fine Ceramic Fibers, A. R. Bunsell and M. H. Berger, Eds. (Marcel Dekker Inc., New York, 1999), Chap. 6, p. 207.
2. F. Bechstedt, P. Käckell, A. Zywietz, K. Karch, B. Adolph, K. Tenelsen, and J. Furthmüller, Phys. Status Solidi B 202, 35 (1997).
3. H. Hobert, H. H. Dunken, S. Urban, F. Falk, and H. Stafast, Vib. Spectrosc. 29, 177 (2002).
4. S. Nakashima and H. Harima, Phys. Status Solidi 162, 39 (1997).
5. Ph. Colomban, Spectrosc. Eur. 15(6), 8 (2003).
6. H. Richter, Z. P. Wang, and L. Ley, Solid State Commun. 39, 625 (1981).
7. M. Montagna and R. Dusi, Phys. Rev. B 52, 10080 (1995).
8. E. Duval, Phys. Rev. B 46, 5795 (1992).
9. A. Tanaka, S. Onari, and T. Arai, Phys. Rev. B 47, 1237 (1993).
10. G. Gouadec and Ph. Colomban, Prog. Cryst. Growth Charact. Mater. 53, 1 (2007).
11. G. Gouadec and Ph. Colomban, J. Raman Spectrosc. 38, 598 (2007).
12. R. Bodet and J. Lamon, Silicates Industriels 1-2, 23 (1996).
13. K. Kumagawa, H. Yamaoka, M. Shibuya, and T. Yamamura, Ceram. Eng. Sci. Proc. 19, 65 (1998).
14. S. Karlin and Ph. Colomban, Composites B 29, 41 (1998).
15. Ph. Colomban, G. Gouadec, and L. Mazerolles, Proceedings of the 103th Annual American Ceramic Society Conference and Exposition, Ceramics Transaction 128, 157 (2001).
16. W. J. Choyke and G. Pensl, MRS Bull. 22, 25 (1997).
17. A. Jayaraman, Rev. Modem Phys. 55, 65 (1983).
18. G. Salvador and W. F. Sherman, J. Mol. Struct. 247, 373 (1991).
19. D. W. Feldman, J. H. Parker, W. J. Choyke, and L. Patrick, Phys. Rev. 170, 698 (1968).
20. Ph. Colomban, G. Gouadec, and L. Mazerolles, Materials and Corrosion-Werkstoffe Und Korrosion 53, 306 (2002).
21. K. Levenberg, Quant. Appl. Math. 2, 164 (1944).
22. R. J. Nemanich, S. A. Solin, and R. M. Martin, Phys. Rev. B 23, 6348 (1981).
23. P. Parayanthal and F. H. Pollak, Phys. Rev. Lett. 52, 1822 (1984).
24. M. Havel, D. Baron, and Ph. Colomban, J. Mater. Sci. 39, 6183 (2004).
25. S.-I. Nakashima, Y. Nakakura, and I. Zenzaburo, J. Phys. Soc. Jap. 56, 359 (1987).
26. D. W. Feldman, J. H. Parker, W. J. Choyke, and L. Patrick, Phys. Rev. 173, 787 (1968).
27. I. Kosacki, V. Petrovsky, H. U. Anderson, and Ph. Colomban, J. Am. Ceram. Soc. 85, 2646 (2002).
28. W. H. Weber, K. C. Hass, and J. R. McBride, Phys. Rev. B 48, 178 (1993).
29. I. Kosacki, T. Suzuki, V. Petrovsky, H. U. Anderson, and Ph. Colomban, Solid State Ionics 149, 99 (2002).
30. M. Dkaki, L. Calcagno, A. M. Makthari, and V. Raineri, Mater. Sci. Semicond. Proc. 4, 201 (2001).