Resonance Raman spectroscopy as a probe of electrosynthesized materials: Principles and selected results

Analytica Chimica Acta

Volumn 397, Issue 1-3, 1999, Pages 43-51

  Boone, B Edward ^a   Gichuhi, Anthony ^a   Shannon, Curtis ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

CdS thin films; Resonance Raman spectroscopy

Indexed keywords

CADMIUM SULFIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; ELECTROLYSIS; FILM; MATERIALS; PARTICLE SIZE; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SEMICONDUCTOR;

EID: 0032826057     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0003-2670(99)00390-6     Document Type: Article

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