메뉴 건너뛰기




Volumn 95, Issue 8, 2011, Pages 2260-2263

Thin crystalline silicon solar cells based on epitaxial films grown at 165 °c by RF-PECVD

Author keywords

Epitaxy; Low temperature; PECVD; Si thin film; Solar cell

Indexed keywords

ABSORBER LAYERS; CRYSTALLINE SILICON SOLAR CELLS; CRYSTALLINE SILICON SUBSTRATES; EXTERNAL QUANTUM EFFICIENCY; FILL FACTOR; HETEROJUNCTION SOLAR CELLS; INTRINSIC LAYER THICKNESS; LIGHT-TRAPPING; LOW TEMPERATURES; P-TYPE; RF-PECVD;

EID: 79958162228     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2011.03.038     Document Type: Article
Times cited : (35)

References (23)
  • 4
    • 44449119020 scopus 로고    scopus 로고
    • Real-time study of a-Si:H/c-Si heterointerface formation and epitaxial Si growth by spectroscopic ellipsometry, infrared spectroscopy and second-harmonic generation
    • J.J.H. Gielis, P.J. van den Oever, B. Hoex, M.C.M. van de Sanden, and W.M.M. Kessels Real-time study of a-Si:H/c-Si heterointerface formation and epitaxial Si growth by spectroscopic ellipsometry, infrared spectroscopy and second-harmonic generation Phys. Rev. B 77 2008 205329
    • (2008) Phys. Rev. B , vol.77 , pp. 205329
    • Gielis, J.J.H.1    Van Den Oever, P.J.2    Hoex, B.3    Van De Sanden, M.C.M.4    Kessels, W.M.M.5
  • 5
    • 33846632881 scopus 로고    scopus 로고
    • Abruptness of a-Si:H/c-Si interface revealed by carrier lifetime measurements
    • S. De Wolf, and M. Kondo Abruptness of a-Si:H/c-Si interface revealed by carrier lifetime measurements Appl. Phys. Lett. 90 2007 042111
    • (2007) Appl. Phys. Lett. , vol.90 , pp. 042111
    • De Wolf, S.1    Kondo, M.2
  • 6
    • 32644488166 scopus 로고    scopus 로고
    • Effect of emitter deposition temperature on surface passivation in hot-wire chemical vapor deposited silicon heterojunction solar cells
    • DOI 10.1016/j.tsf.2005.07.196, PII S0040609005010692, Proceedings of the Third International Conference on Hot-Wire
    • T. Wang, E. Iwaniczko, M. Page, D. Levi, Y. Yan, H. Branz, and Q. Wang Effect of emitter deposition temperature on surface passivation in hot-wire chemical vapor deposited silicon heterojunction solar cells Thin Solid Films 501 2006 284 287 (Pubitemid 43245585)
    • (2006) Thin Solid Films , vol.501 , Issue.1-2 , pp. 284-287
    • Wang, T.H.1    Iwaniczko, E.2    Page, M.R.3    Levi, D.H.4    Yan, Y.5    Branz, H.M.6    Wang, Q.7
  • 7
    • 63749125326 scopus 로고    scopus 로고
    • Toward a better physical understanding of a-Si:H/c-Si heterojunction solar cells
    • J. Damon-Lacoste, and P. Roca i Cabarrocas Toward a better physical understanding of a-Si:H/c-Si heterojunction solar cells J. Appl. Phys. 105 2009 063712
    • (2009) J. Appl. Phys. , vol.105 , pp. 063712
    • Damon-Lacoste, J.1    Roca I Cabarrocas, P.2
  • 8
    • 77952564537 scopus 로고    scopus 로고
    • Plasmas for texturing, cleaning and deposition: Towards a one pump down process for heterojunction solar cells
    • M. Moreno, D. Daineka, and P. Roca i Cabarrocas Plasmas for texturing, cleaning and deposition: towards a one pump down process for heterojunction solar cells Phys. Status Solidi c 7 2010 1112 1115
    • (2010) Phys. Status Solidi C , vol.7 , pp. 1112-1115
    • Moreno, M.1    Daineka, D.2    Roca I Cabarrocas, P.3
  • 9
    • 84991987500 scopus 로고    scopus 로고
    • Ultra-thin crystalline silicon films produced by plasma assisted epitaxial growth on silicon wafers and their transfer to foreign substrates
    • M. Moreno, and P. Roca i Cabarrocas Ultra-thin crystalline silicon films produced by plasma assisted epitaxial growth on silicon wafers and their transfer to foreign substrates PV Direct 1 2010 10301
    • (2010) PV Direct , vol.1 , pp. 10301
    • Moreno, M.1    Roca I Cabarrocas, P.2
  • 10
    • 0000472026 scopus 로고    scopus 로고
    • Smart-cut: A new silicon on insulator material technology based on hydrogen implantation and wafer bonding
    • M. Bruel, B. Aspar, and A.-J. Auberton-Hervé Smart-cut: a new silicon on insulator material technology based on hydrogen implantation and wafer bonding Jpn. J. Appl. Phys. 36 1997 1636 1641
    • (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 1636-1641
    • Bruel, M.1    Aspar, B.2    Auberton-Hervé, A.-J.3
  • 11
    • 76049121729 scopus 로고    scopus 로고
    • Ultra-shallow junctions formed by quasi-epitaxial growth of boron and phosphorous-doped silicon films at 175 °c by rf-PECVD
    • M. Labrune, M. Moreno, and P. Roca i Cabarrocas Ultra-shallow junctions formed by quasi-epitaxial growth of boron and phosphorous-doped silicon films at 175 °C by rf-PECVD Thin Solid Films 518 2010 2528 2530
    • (2010) Thin Solid Films , vol.518 , pp. 2528-2530
    • Labrune, M.1    Moreno, M.2    Roca I Cabarrocas, P.3
  • 12
    • 0001213089 scopus 로고
    • Mechanism of HF etching of silicon surfaces: A theoretical understanding of hydrogen passivation
    • G.W. Trucks, K. Raghavachari, G.S. Higashi, and Y.J. Chabal Mechanism of HF etching of silicon surfaces: a theoretical understanding of hydrogen passivation Phys. Rev. Lett. 65 1990 504
    • (1990) Phys. Rev. Lett. , vol.65 , pp. 504
    • Trucks, G.W.1    Raghavachari, K.2    Higashi, G.S.3    Chabal, Y.J.4
  • 14
    • 79958106214 scopus 로고    scopus 로고
    • 〈 http://www.pv.unsw.edu.au 〉.
  • 15
    • 33847596250 scopus 로고
    • Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs and InSb from 1.5 to 6.0 eV
    • D.E. Aspnes, and A.A. Studna Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs and InSb from 1.5 to 6.0 eV Phys. Rev. B 27 1983 985
    • (1983) Phys. Rev. B , vol.27 , pp. 985
    • Aspnes, D.E.1    Studna, A.A.2
  • 17
    • 84954824794 scopus 로고
    • Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen. I. Dielektrizitätskonstanten und Leitfähigkeiten der Mischkörper aus isotropen Substanzen
    • D.A.G. Bruggeman Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen. I. Dielektrizitätskonstanten und Leitfähigkeiten der Mischkörper aus isotropen Substanzen Annalen der Physik 416 1935 636 664
    • (1935) Annalen der Physik , vol.416 , pp. 636-664
    • Bruggeman, D.A.G.1
  • 18
    • 0029359920 scopus 로고
    • In situ measurements of changes in the structure and in the excess charge-carrier kinetics at the silicon surface during hydrogen and helium plasma exposure
    • H.C. Neitzert, N. Layadi, P. Roca i Cabarrocas, R. Vanderhaghen, and M. Kunst In situ measurements of changes in the structure and in the excess charge-carrier kinetics at the silicon surface during hydrogen and helium plasma exposure J. Appl. Phys. 78 1995 1438
    • (1995) J. Appl. Phys. , vol.78 , pp. 1438
    • Neitzert, H.C.1    Layadi, N.2    Roca I Cabarrocas, P.3    Vanderhaghen, R.4    Kunst, M.5
  • 19
    • 0027882071 scopus 로고
    • Phase modulated ellipsometry from the ultraviolet to the infrared: In situ application to the growth of semiconductors
    • B. Drévillon Phase modulated ellipsometry from the ultraviolet to the infrared: in situ application to the growth of semiconductors Prog. Cryst. Growth Charact. Mater. 27 1993 1 87
    • (1993) Prog. Cryst. Growth Charact. Mater. , vol.27 , pp. 1-87
    • Drévillon, B.1
  • 22
    • 2942527301 scopus 로고    scopus 로고
    • Contribution of plasma generated nanocrystals to the growth of microcrystalline silicon thin films
    • S. Kasouit, J. Damon-Lacoste, R. Vanderhaghen, and P. Roca i Cabarrocas Contribution of plasma generated nanocrystals to the growth of microcrystalline silicon thin films J. Non-Cryst. Solids 338340 2004 86 90
    • (2004) J. Non-Cryst. Solids , vol.338-340 , pp. 86-90
    • Kasouit, S.1    Damon-Lacoste, J.2    Vanderhaghen, R.3    Roca I Cabarrocas, P.4
  • 23
    • 70349554489 scopus 로고    scopus 로고
    • Simulation and fabrication of heterojunction silicon solar cells from numerical computer and hot-wire CVD
    • S.-Y. Lien, and D.-S. Wuu Simulation and fabrication of heterojunction silicon solar cells from numerical computer and hot-wire CVD Prog. Photovoltaics 17 2009 489
    • (2009) Prog. Photovoltaics , vol.17 , pp. 489
    • Lien, S.-Y.1    Wuu, D.-S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.