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Volumn 323, Issue 1, 2011, Pages 72-75

Growth and characterization of InGaN by RF-MBE

(10) Kraus, A a Hammadi, S a Hisek, J a Buss R a Jonen H a Bremers, H a Rossow, U a Sakalauskas, E b Goldhahn, R b,c Hangleiter, A a

a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG (Germany)

b ILMENAU UNIVERSITY OF TECHNOLOGY (Germany)

c OTTO VON GUERICKE UNIVERSITY (Germany)

Author keywords

Crystal structure; InGaN; Molecular beam epitaxy; Spectroscopic ellipsometry; X ray diffraction

Indexed keywords

AFM; CRYSTALLINE QUALITY; GAN TEMPLATE; GROWTH CONDITIONS; IN-SITU; INGAN; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS;

GALLIUM NITRIDE; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL STRUCTURE;

EID: 79957996655 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2010.10.124 Document Type: Article

Times cited : (31)

References (11)

1
- 0345330006
- J. Wu, W. Walukiewicz, K.M. Yu, W. Shan, J.W. Ager, E.E. Haller, H. Lu, W.J. Schaff, W.K. Metzger, and S. Kurtz J. Appl. Phys. 94 2003 6477
- (2003) J. Appl. Phys. , vol.94 , pp. 6477
- Wu, J.¹ Walukiewicz, W.² Yu, K.M.³ Shan, W.⁴ Ager, J.W.⁵ Haller, E.E.⁶ Lu, H.⁷ Schaff, W.J.⁸ Metzger, W.K.⁹ Kurtz, S.¹⁰

2
- 36549008701
- F. Yam, and Z. Hassan Superlattices Microstructures 43 2008 1
- (2008) Superlattices Microstructures , vol.43 , pp. 1
- Yam, F.¹ Hassan, Z.²

3
- 33646005805
- X. Wang, S.B. Che, Y. Ishitani, and A. Yoshikawa J. Appl. Phys. 99 2006 073512
- (2006) J. Appl. Phys. , vol.99 , pp. 073512
- Wang, X.¹ Che, S.B.² Ishitani, Y.³ Yoshikawa, A.⁴

4
- 27744497957
- T.L. Song J. Appl. Phys. 98 2005 084906
- (2005) J. Appl. Phys. , vol.98 , pp. 084906
- Song, T.L.¹

5
- 0032181962
- O. Ambacher J. Phys. D.: Appl. Phys. 31 1998 2653
- (1998) J. Phys. D.: Appl. Phys. , vol.31 , pp. 2653
- Ambacher, O.¹

6
- 0039142806
- T. Böttcher, S. Einfeldt, V. Kirchner, S. Figge, H. Heinke, D. Hommel, H. Selke, and P.L. Ryder Appl. Phys. Lett. 73 1998 3232
- (1998) Appl. Phys. Lett. , vol.73 , pp. 3232
- Böttcher, T.¹ Einfeldt, S.² Kirchner, V.³ Figge, S.⁴ Heinke, H.⁵ Hommel, D.⁶ Selke, H.⁷ Ryder, P.L.⁸

7
- 42149109075
- Y.E. Romanyuk, L.D. Kranz, and S.R. Leone J. Appl. Phys. 103 2008 073104
- (2008) J. Appl. Phys. , vol.103 , pp. 073104
- Romanyuk, Y.E.¹ Kranz, L.D.² Leone, S.R.³

8
- 31144464554
- E. Iliopoulos, A. Georgakilas, E. Dimakis, A. Adikimenakis, K. Tsagaraki, M. Androulidaki, and N.T. Pelekanos Phys. Status Solidi (a) 203 2006 102 105
- (2006) Phys. Status Solidi (A) , vol.203 , pp. 102-105
- Iliopoulos, E.¹ Georgakilas, A.² Dimakis, E.³ Adikimenakis, A.⁴ Tsagaraki, K.⁵ Androulidaki, M.⁶ Pelekanos, N.T.⁷

9
- 58149215609
- H. Fang, L.W. Sang, L.B. Zhao, S.L. Qi, Y.Z. Zhang, X.L. Yang, Z.J. Yang, and G.Y. Zhang Appl. Phys. Lett. 93 2008 261117
- (2008) Appl. Phys. Lett. , vol.93 , pp. 261117
- Fang, H.¹ Sang, L.W.² Zhao, L.B.³ Qi, S.L.⁴ Zhang, Y.Z.⁵ Yang, X.L.⁶ Yang, Z.J.⁷ Zhang, G.Y.⁸

10
- 23044524050
- H. Chen, R.M. Feenstra, J.E. Northrup, T. Zywietz, J. Neugebauer, and D.W. Greve Papers from the 27th Conference on the Physics and Chemistry of Semiconductor Interfaces 18 2000 2284 2289
- (2000) Papers from the 27th Conference on the Physics and Chemistry of Semiconductor Interfaces , vol.18 , pp. 2284-2289
- Chen, H.¹ Feenstra, R.M.² Northrup, J.E.³ Zywietz, T.⁴ Neugebauer, J.⁵ Greve, D.W.⁶

11
- 34347359632
- P. Schley, R. Goldhahn, A.T. Winzer, G. Gobsch, V. Cimalla, O. Ambacher, H. Lu, W.J. Schaff, M. Kurouchi, Y. Nanishi, M. Rakel, C. Cobet, and N. Esser Phys. Rev. B 75 2007 205204
- (2007) Phys. Rev. B , vol.75 , pp. 205204
- Schley, P.¹ Goldhahn, R.² Winzer, A.T.³ Gobsch, G.⁴ Cimalla, V.⁵ Ambacher, O.⁶ Lu, H.⁷ Schaff, W.J.⁸ Kurouchi, M.⁹ Nanishi, Y.¹⁰ Rakel, M.¹¹ Cobet, C.¹² Esser, N.¹³

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