Infrared spectroscopic and electron microscopic characterization of gold nanogap structure fabricated by focused ion beam

Nanotechnology

Volumn 22, Issue 27, 2011, Pages

  Han, G ^a   Weber, D ^b   Neubrech, F ^b   Yamada, I ^a   Mitome, M ^a   Bando, Y ^a   Pucci, A ^b   Nagao, T ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE X-RAY SPECTROMETRY; FOCUSED ION BEAM MILLING; GAP REGIONS; GOLD NANOROD; INFRARED SPECTROSCOPIC; INFRARED SPECTRUM; MICROSCOPIC CHARACTERIZATION; NANO-GAP; PLASMONIC; SCANNING ELECTRON MICROSCOPY IMAGE; TRANSMISSION ELECTRON MICROGRAPH;

BEHAVIORAL RESEARCH; DIMERS; ELECTRON BEAMS; FOCUSED ION BEAMS; INFRARED SPECTROSCOPY; NANORODS; OPTICAL CORRELATION; PLASMONS; RESONANCE; SCANNING ELECTRON MICROSCOPY; STRUCTURAL PROPERTIES;

ELECTRONS;

EID: 79957834614     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/27/275202     Document Type: Article

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