The thermal stability of Pt/Ir coated AFM tips for resistive switching measurements

Applied Surface Science

Volumn 257, Issue 17, 2011, Pages 7627-7632

  Wojtyniak, M ^a,b   Szot, K ^a,b   Waser, R ^b,c  

^a UNIVERSITY OF SILESIA   (Poland)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

^c RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Atomic force microscopy; Pt coating; Resistive switching; Tip temperature stability

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOPROBES; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON OXIDES; SWITCHING; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL COMPOSITIONS; ELECTRICAL BEHAVIORS; ELECTRICAL CONDUCTIVITY; ELEVATED TEMPERATURE; OXIDIZING CONDITIONS; REDUCING CONDITIONS; RESISTIVE SWITCHING; TEMPERATURE STABILITY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79957511801     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.03.149     Document Type: Article

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