Frictional properties of a mesoscopic contact with engineered surface roughness

Tribology Letters

Volumn 42, Issue 3, 2011, Pages 319-324

  Sondhauß, Johannes ^a   Fuchs, Harald ^a   Schirmeisen, André ^b  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

AFM; Focused ion beam; Silicon; Surface roughness; Titanium; Unlubricated friction

Indexed keywords

AFM; ENGINEERED SURFACES; FRICTION COEFFICIENTS; FRICTION FORCE MICROSCOPE; FRICTIONAL PROPERTIES; GROOVE DEPTH; GROOVE WIDTH; MESOSCALE; MESOSCOPICS; PERIODIC STRIPE PATTERN; SILICON SURFACES; STRONG ENHANCEMENT; TRIBOLOGICAL BEHAVIORS; UNLUBRICATED FRICTION;

ATOMIC FORCE MICROSCOPY; BEHAVIORAL RESEARCH; FOCUSED ION BEAMS; FRICTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SPHERES; SURFACE PROPERTIES; TITANIUM; TRIBOLOGY;

SURFACE ROUGHNESS;

EID: 79957486484     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11249-011-9776-8     Document Type: Article

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