Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy

Review of Scientific Instruments

Volumn 79, Issue 2, 2008, Pages

  Schmutz, Jan Erik ^a   Schäfer, Marcus M ^a   Hölscher, Hendrik ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COLLOIDS; FOCUSED ION BEAMS; FRICTION; GLUES;

COLLOID PROBES; DYNAMIC FORCE MICROSCOPY; FRICTION FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COLLOID; ENERGY TRANSFER; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; FRICTION; IMAGE ENHANCEMENT; INSTRUMENTATION; MECHANICAL STRESS; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

COLLOIDS; ENERGY TRANSFER; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; FRICTION; IMAGE ENHANCEMENT; MICROSCOPY, ATOMIC FORCE; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; STRESS, MECHANICAL; TRANSDUCERS;

EID: 40149100160     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2839020     Document Type: Article

References (28)

1. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.56.930 56, 930 (1986).
2. W. A. Ducker, T. J. Senden, and R. M. Pashley, Nature (London) NATUAS 0028-0836 10.1038/353239a0 353, 239 (1991).
3. H.-J. Butt, Biophys. J. BIOJAU 0006-3495 60, 1438 (1991).
4. U. Mohideen and A. Roy, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.81.4549 81, 4549 (1998).
5. L. H. G. J. Segeren, B. Siebum, F. G. Karssenberg, J. A. van den Berg, and G. J. Vancso, J. Adhes. Sci. Technol. JATEE8 0169-4243 10.1163/ 156856102760136418 16, 793 (2002).
6. L. O. Heim, S. Ecke, M. Preuss, and H.-J. Butt, J. Adhes. Sci. Technol. JATEE8 0169-4243 10.1163/156856102760136427 16, 829 (2002).
7. S. Biggs, R. G. Cain, R. R. Dagastine, and N. W. Page, J. Adhes. Sci. Technol. JATEE8 0169-4243 10.1163/156856102760136445 16, 869 (2002).
8. Y. I. Rabinovich, M. S. Esayanur, K. D. Johanson, J. J. Adler, and B. M. Moudgil, J. Adhes. Sci. Technol. JATEE8 0169-4243 16, 887 (2002).
9. S. C. Clark, J. Y. Walz, and W. A. Ducker, Langmuir LANGD5 0743-7463 20, 7616 (2004).
10. J. Gobelny, N. Pradeep, D.-I. Kim, and Z. C. Ying, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2181200 88, 091906 (2006).
11. L. H. Mak, M. Knoll, D. Weiner, A. Gorschlüter, A. Schirmeisen, and H. Fuchs, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.2190068 77, 046104 (2006).
12. Y. Gan, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.2754076 78, 081101 (2007).
13. M. A. Lantz, S. P. Jarvis, and H. Tokumoto, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1339840 78, 383 (2001).
14. Q. K. Ong and I. Sokolov, J. Colloid Interface Sci. JCISA5 0021-9797 310, 385 (2007).
15. I. U. Vakarelski and K. Higashitani, Langmuir LANGD5 0743-7463 10.1021/la0528145 22, 2931 (2006).
16. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.59.1942 59, 1942 (1987).
17. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.338807 61, 4723 (1987).
18. R. Giles, J. P. Cleveland, S. Manne, P. K. Hansma, B. Drake, P. Maivald, C. Boles, J. Gurley, and V. B. Elings, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.109967 63, 617 (1993).
19. Q. D. Zhong, D. Inniss, K. Kjoller, and V. B. Elings, Surf. Sci. Lett. SUSCAS 0167-2584 10.1016/0039-6028(93)90582-5 290, L688 (1993).
20. P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, and V. Elings, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.111795 64, 1738 (1994).
21. C. A. J. Putman, K. O. Vanderwerf, B. G. Degrooth, N. F. Vanhulst, and J. Greve, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.111597 64, 2454 (1994).
22. H. Hölscher and U. D. Schwarz, Int. J. Non-Linear Mech. IJNMAG 0020-7462 10.1016/j.ijnonlinmec.2007.01.018 42, 608 (2007).
23. E. Meyer, H.-J. Hug, and R. Bennewitz, Scanning Probe Microscopy-The Lab on a Tip (Springer, Berlin, 2004).
24. P. Günther, U. C. Fischer, and K. Dransfeld, Appl. Phys. B: Photophys. Laser Chem. APPCDL 0721-7269 10.1007/BF00694423 48, 89 (1989).
25. H. Hosaka, K. Itao, and S. Kuroda, Sens. Actuators, A SAAPEB 0924-4247 10.1016/0924-4247(95)01003-J 49, 87 (1995).
26. S. J. O'Shea and M. E. Welland, Langmuir LANGD5 0743-7463 10.1021/la9801864 14, 4186 (1998).
27. O. I. Vinogradova, H.-J. Butt, G. E. Yakubov, and F. Feuillebois, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1366630 72, 2330 (2001).
28. A. Maali, T. Coehn-Bouhacina, C. Jai, C. Hurth, R. Boisgard, J. P. Aiḿ, D. Mariolle, and F. Bertin, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2163996 99, 024908 (2006).