Reproducible attachment of micrometer sized particles to atomic force microscopy cantilevers

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Mak, L H ^a   Knoll, M ^a   Weiner, D ^a   Gorschluter A ^a   Schirmeisen, A ^a   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; MANIPULATORS; MICROMETERS; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

CONTACT AREA; MICROPIPETTE; MICROSPHERES;

ELEMENTARY PARTICLES;

EID: 33646432501     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2190068     Document Type: Article

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