Simultaneous topographical and optical characterization of near-field optical aperture probes by way of imaging fluorescent nanospheres

Applied Physics Letters

Volumn 80, Issue 8, 2002, Pages 1331-1333

  Hoppener C ^a   Molenda, D ^a   Fuchs, H ^a   Naber, A ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APERTURE PROBES; FLUORESCENT NANOSPHERES; INTENSITY DISTRIBUTION; NEAR FIELD PROBES; NEAR-FIELD; OPTICAL APERTURE; OPTICAL CHARACTERIZATION; OPTICAL FLUORESCENCE; OPTICAL RESOLUTION; SAMPLE SURFACE; SCANNING NEAR-FIELD OPTICAL MICROSCOPY; SMOOTH GLASS;

FLUORESCENCE; NANOSPHERES; PROBES; SUBSTRATES;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 79956055672     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1454220     Document Type: Article

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