Growth and surface characterization of V 2O 5 thin films made by pulsed-laser deposition

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 6, 2004, Pages 2453-2458

  Ramana, C V ^a,d   Smith, R J ^a   Hussain, O M ^b   Julien, C M ^c  

^a MONTANA STATE UNIVERSITY   (United States)

^b SRI VENKATESWARA UNIVERSITY   (India)

^c SORBONNE UNIVERSITÉ   (France)

^d MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN DISTRIBUTION; LASER FLUENCES; PHASE INSTABILITY; STRUCTURAL SYMMETRY;

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; CRYSTAL SYMMETRY; CRYSTALLIZATION; EXCIMER LASERS; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; SURFACE PROPERTIES; THERMAL EFFECTS; THIN FILMS; VANADIUM COMPOUNDS;

FILM GROWTH;

EID: 10244278038     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1809123     Document Type: Article

References (24)

1. C. G. Granqvist, Handbook of Inorganic Electrochromic Materials (Elseveier, New York, 1995).
2. K. Nagase, Y. Shimuzu, N. Miura, and N. Yamazoe, Appl. Phys. Lett. 61, 243 (1992).
3. S. F. Cogan, N. M. Nguyen, S. J. Perrotti, and R. D. Rauh, J. Appl. Phys. 66, 1333 (1989).
4. G. J. Fang, Z. L. Liu, Y. Wang, Y. H. Liu, and K. L. Yao, J. Vac. Sci. Technol. A 19, 887 (2001).
5. S.-H. Lee, P. Liu, C. E. Tracy, and D. K. Benson, Electrochem. Solid-State Lett. 2, 425 (1999).
6. C. Julien, Ionics 2, 169 (1996).
7. C. V. Ramana, O. M. Hussain, S. Uthanna, and B. Srinivasulu Naidu, Opt. Mater. (Amsterdam, Neth.) 10, 101 (1998).
8. A. Z. Moshfegh and A. Ignatiev, Thin Solid Films 198, 253 (1991).
9. G. Micocci, A. Serra, A. Tepore, S. Capone, R. Rella and P. Siciliano, J. Vac. Sci. Technol. A 15, 34 (1997).
10. S. D. Hansen and C. R. Aim, J. Vac. Sci. Technol. A 3, 660 (1985).
11. C. V. Ramana, O. M. Hussain, B. Srinivasulu Naidu, and P. J. Reddy, Thin Solid Films 35, 219 (1997).
12. C. V. Ramana, B. S. Naidu, O. M. Hussain, and R. Pinto, J. Phys. D 34, L35 (2001).
13. C. Julien, E. Haro-Poniatowski, O. M. Hussain, and C. V. Ramana, Ionics 7, 165 (2001).
14. J.-G. Zhang, J. M. McGraw, and D. J. Ginley, Electrochem. Soc. Interface 144, 1630 (1997).
15. C. Julien, E. Haro-Poniatowski, M. A. Camacho-Lopez, L. Escobar-Alarcon, and J. Jimenez-Jarquin, Mater. Sci. Eng., B 65, 170 (1999).
16. G. J. Fang, K. L. Yao, and Z. L. Liu, Thin Solid Films 394, 64 (2001).
17. G. J. Fang, Z. L. Liu, Y. Q. Wang, H. H. Liu, and K. L. Yao, J. Phys. D 33, 3018 (2000).
18. C. V. Ramana, O. M. Hussain, R. Pinto, and C. Julien, Appl. Surf. Sci. 207, 135 (2003).
19. C. Kittel, Introduction to Solid State Physics (Wiley, New York, 1968).
20. L. Abello, E. Husson, Y. Repelin, and G. Lucazeau, Spectrochim. Acta, Part A 39, 641 (1983).
21. C. Julien, J. P. Guesdon, A. Gorenstein, A. Khelfa, and I. Ivanov, Appl. Surf. Sci. 90, 389 (1995).
22. J. A. Roro, C. V. Thompson, R. Carel, and P. D. Bristowe, J. Mater. Res. 9, 2411 (1994).
23. R. W. Vook and F. Witt, J. Appl. Phys. 36, 2169 (1965).
24. Z.-J. Liu and Y. G. Shen, Appl. Phys. Lett. 83, 5404 (2003).