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Volumn 2, Issue 9, 2010, Pages 2623-2628

Effect of structure and size on the electrical properties of nanocrystalline WO3 films

Author keywords

electrical properties; H2S sensors; size effects; small polaron hopping; variable range hopping; WO3 thin films

Indexed keywords

ELECTRICAL PROPERTY; H2S SENSORS; SIZE EFFECTS; SMALL POLARON HOPPING; VARIABLE RANGE HOPPING; WO3 THIN FILMS;

EID: 79151477150     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am1004514     Document Type: Article
Times cited : (165)

References (44)
  • 26
    • 79151470133 scopus 로고    scopus 로고
    • hkl = 0.9λ/βcos θ, where d is the size, λ is the wavelength of the filament used in the XRD machine, β is the width of a peak at half of its intensity, and θ is the angle of the peak.
    • hkl = 0.9λ/βcos θ, where d is the size, λ is the wavelength of the filament used in the XRD machine, β is the width of a peak at half of its intensity, and θ is the angle of the peak.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.