Reversible changes in the lattice site structure for in implanted into GaN

Applied Physics Letters

Volumn 80, Issue 24, 2002, Pages 4531-4533

  Lorenz, K ^a   Ruske, F ^a   Vianden, R ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMPLANTATION INDUCED DAMAGES; LATTICE SITES; LOW TEMPERATURES; PERTURBED ANGULAR CORRELATION; REVERSIBLE CHANGE;

PHYSICAL PROPERTIES; PHYSICS;

GALLIUM NITRIDE;

EID: 79956036563     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1485117     Document Type: Article

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