Structural and optical properties of wurtzite Mgx Zn 1-xS (0≤x≤0.25) films grown on (0001) Al2O 3 by pulsed-laser deposition

Applied Physics Letters

Volumn 81, Issue 8, 2002, Pages 1444-1446

  Ong, H C ^a   Dai, J Y ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BAND EDGE; CRITICAL THICKNESS; CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; CRYSTALLINITIES; EPITAXIALLY GROWN; HIGH RESOLUTION; HIGH-QUALITY FILMS; INTERFACIAL REGION; ROCKING CURVES; ROOM TEMPERATURE; STRUCTURAL AND OPTICAL PROPERTIES; TRANSMISSION SPECTROSCOPY; WURTZITE MATERIALS; WURTZITES; ZINC-BLENDE;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; ZINC; ZINC SULFIDE;

PULSED LASERS;

EID: 79956017745     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1502191     Document Type: Article

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