Comparative study of typical defects in III-nitride thin films and their alloys

Materials Research Society Symposium - Proceedings

Volumn 482, Issue , 1997, Pages 411-416

  Dovidenko, K ^a   Oktyabrsky, S ^a   Narayan, J ^a   Joshkin, V ^a   Razeghi, M ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRIC PROPERTIES; GRAIN BOUNDARIES; HETEROJUNCTIONS; METALLOGRAPHIC MICROSTRUCTURE; OPTICAL PROPERTIES; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR GROWTH; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

DIFFRACTION CONTRAST ANALYSIS; INVERSION DOMAINS; MULTIPLE DARK FIELD IMAGING;

SEMICONDUCTING FILMS;

EID: 0031379854     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-482-411     Document Type: Conference Paper

References (10)