메뉴 건너뛰기




Volumn 81, Issue 7, 2002, Pages 1204-1206

Intrinsic tensile stress and grain boundary formation during Volmer-Weber film growth

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE STRESS; EXPERIMENTAL OBSERVATION; FINITE ELEMENT CALCULATIONS; GROWTH PROCESS; POLYCRYSTALLINE FILM; STRESS EVOLUTION; VOLMER-WEBER FILM GROWTH;

EID: 79956013395     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1494459     Document Type: Article
Times cited : (48)

References (14)
  • 2
    • 0001536019 scopus 로고
    • tsf THSFAP 0040-6090
    • R. W. Hoffman, Thin Solid Films 34, 185 (1976). tsf THSFAP 0040-6090
    • (1976) Thin Solid Films , vol.34 , pp. 185
    • Hoffman, R.W.1
  • 4
    • 0025555186 scopus 로고
    • vac VACUAV 0042-207X
    • G. Thurner and R. Abermann, Vacuum 41, 1300 (1990). vac VACUAV 0042-207X
    • (1990) Vacuum , vol.41 , pp. 1300
    • Thurner, G.1    Abermann, R.2
  • 9
    • 79957969150 scopus 로고    scopus 로고
    • K. H. A. Lau, thesis, Brown University, 2001
    • K. H. A. Lau, thesis, Brown University, 2001.
  • 13
    • 79957942295 scopus 로고    scopus 로고
    • A. Rajamani and B. W. Sheldon (unpublished)
    • A. Rajamani and B. W. Sheldon (unpublished).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.