Determination of the thickness of Al2O3 barriers in magnetic tunnel junctions

Applied Physics Letters

Volumn 81, Issue 4, 2002, Pages 751-753

  Buchanan, J D R ^a   Hase, T P A ^a   Tanner, B K ^a   Hughes, N D ^b   Hicken, R J ^b  

^a DURHAM UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF EXETER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BARRIER STRUCTURES; BARRIER THICKNESS; ELECTRON-TUNNELING MODEL; GRAZING INCIDENCE X-RAY REFLECTIVITIES; MAGNETIC TUNNEL JUNCTION; OXIDATION TIME; SIMMONS MODEL; SPIN-DEPENDENT TUNNEL JUNCTIONS; TUNNELING CURRENT;

ALUMINUM; ELECTRON TUNNELING; GLOW DISCHARGES; OPTICS; REFLECTION;

TUNNEL JUNCTIONS;

EID: 79955984191     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1496131     Document Type: Article

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