High-resolution electron microscopy study of tunnelling junctions with AlN and AlON barriers

Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 6874-6876

  Shang, Ping ^a   Petford Long, Amanda K ^a   Nickel, Janice H ^b   Sharma, Manish ^b   Anthony, Thomas C ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347572235     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1357835     Document Type: Article

References (10)

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