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Science of Advanced Materials

Volumn 3, Issue 1, 2011, Pages 73-79

Effect of annealing on the characteristics of nanocrystalline ZnO thin films

(2) Periasamy, C a Chakrabarti, P a

a BANARAS HINDU UNIVERSITY (India)

Author keywords

Atomic Force microscope.; Optical properties; Structural properties; Surface morphology; ZnO thin film

Indexed keywords

EID: 79955750318 PISSN: 19472935 EISSN: 19472943 Source Type: Journal
DOI: 10.1166/sam.2011.1133 Document Type: Article

Times cited : (22)

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