Subsurface examination of a foliar biofilm using scanning electron- and focused-ion-beam microscopy

Micron

Volumn 42, Issue 6, 2011, Pages 579-585

  Wallace, Patricia Kay ^a   Arey, Bruce ^b   Mahaffee, Walter F ^a,c  

^a OREGON STATE UNIVERSITY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c HORTICULTURAL CROPS RESEARCH LABORATORY   (United States)

Author keywords

FIB SIM; Phyllosphere

Indexed keywords

BACTERIA CELL; BACTERIAL BIOFILM; BACTERIAL CELLS; BIOLOGICAL CONTROL AGENT; BIOLOGICAL TISSUES; BURKHOLDERIA; CELL LAYERS; CROSS SECTION; CRYOFIXATION; DUAL BEAM; EMPTY SPACE; FIB MILLING; FIB SEM; FIB SIM; FROZEN LAYER; LEAF SURFACES; PHYLLOSPHERE; SCANNING ELECTRONS; SEM; SINGLE SITES; SUBSURFACE EXPLORATION; SUBSURFACE STRUCTURES;

BACTERIA; BACTERIOLOGY; ELECTRON BEAMS; ELECTRONS; ION BEAMS; IONS; SCANNING; SCANNING ELECTRON MICROSCOPY; SURFACES; TISSUE;

BIOFILMS;

ARTICLE; BIOFILM; BURKHOLDERIA; CRYOPRESERVATION; GERANIUM; METHODOLOGY; MICROBIOLOGY; PHYSIOLOGY; PLANT LEAF; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE;

BIOFILMS; BURKHOLDERIA; CRYOPRESERVATION; GERANIUM; MICROSCOPY, ELECTRON, SCANNING; PLANT LEAVES;

BACTERIA (MICROORGANISMS); BURKHOLDERIA;

EID: 79955607642     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2011.02.003     Document Type: Article

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