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Volumn 212, Issue 9, 2011, Pages 905-914

Crystalline monolayer ordering at substrate/polymer interfaces in poly(3-hexylthiophene) ultrathin films

Author keywords

atomic force microscopy; crystallization; grazing incidence X ray diffraction; poly(3 hexylthiophene); ultrathin films

Indexed keywords

AFM; CHAIN MOBILITY; CRYSTALLINE LAYERS; FILM/SUBSTRATE INTERFACE; GRAZING INCIDENCE X-RAY DIFFRACTION; INTERFACE FREE ENERGY; NANO-CRYSTALLINE STRUCTURES; POLY(3-HEXYLTHIOPHENE); SINGLE LAMELLA; STATIC CONTACT ANGLE; SUBSTRATE NATURE; SUBSTRATE PROPERTIES; ULTRA-THIN;

EID: 79955547603     PISSN: 10221352     EISSN: 15213935     Source Type: Journal    
DOI: 10.1002/macp.201000753     Document Type: Article
Times cited : (27)

References (52)
  • 27
    • 0003869875 scopus 로고    scopus 로고
    • Software Version 5.12 revision B, VEECO, Santa Barbara
    • Nanoscope Command Reference Manual, Software Version 5.12 revision B, VEECO, Santa Barbara 2001, p. 25.
    • (2001) Nanoscope Command Reference Manual , pp. 25


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.